Characterization
Transport and mechanical properties combined with morphological characterization through synchrotron X-ray techniques to establish structure-property relationships and study chemical-mechanical degradation and durability
Characterization of Functional Polymers and Thin Films
Complex nature of ion-conductive polymers along with their environment-dependent properties require a myriad of techniques to characterize their hydration, transport, mechanical and structural properties. We carry out most of these studies in controlled environment from humidity- and temperature-controlled conditions to in-situ measurements in liquid water and electrolytes using various techniques illustrated below. We also perform morphological characterization of these functional polymers and thin films using advanced synchrotron x-ray techniques in various beamlines at the Advanced Light Source (ALS). Our structural characterization studies involve not only implementation of existing techniques for investigation ion-conductive polymers, but also development of in-situ and operando stages for characterization of functional polymers and interfaces using techniques such as: tranmission small and wide-angle x-ray scattering and diffraction (SAXS/WAXS/XRD), grazing-incidence x-ray scattering (GISAXS/GIWAXS), resonant soft x-ray scattering (RSoX), and x-ray absorption spectroscopy (XAS) using the beamlines at the ALS.
Structural Characterization with X-rays
Complex nature of ion-conductive polymers along with their environment-dependent properties require a myriad of techniques to characterize their hydration, transport, mechanical and structural properties. We carry out most of these studies in controlled environment from humidity- and temperature-controlled conditions to in-situ measurements in liquid water and electrolytes using various techniques illustrated below. We also perform morphological characterization of these functional polymers and thin films using advanced synchrotron x-ray techniques in various beamlines at the Advanced Light Source (ALS). Our structural characterization studies involve not only implementation of existing techniques for investigation ion-conductive polymers, but also development of in-situ and operando stages for characterization of functional polymers and interfaces using techniques such as: tranmission small and wide-angle x-ray scattering and diffraction (SAXS/WAXS/XRD), grazing-incidence x-ray scattering (GISAXS/GIWAXS), resonant soft x-ray scattering (RSoX), and x-ray absorption spectroscopy (XAS) using the beamlines at the ALS.
Transport-Stability Characterization
Our research studies employ a myriad of advanced in-situ characterization techniques for hydration, transport and thermal-mechanical properties of functional polymers with environmental controls (temperature, solvents, humidity). Our group has extensive experience and equipment dedicated to the characterization of ion-conductive thin film and bulk polymer electrolytes, as well as their interfaces, as found in various electrochemical devices and electrode structures, such as fuel cells, flow batteries, photoelectrochemical assemblies, as well as low temperature polymer-based electrolysis. This includes both anion and cation-exchange ionomers from micrometer-thick membrane separators to nanometer-thick thin films on support materials as found in electrodes of devices, which could be used to elucidate the underlying origins of ionomer behavior and guide the relevant material design studies.